Scanning Electron Microscopy (SEM) & SEM Analysis

Scanning Electron Microscopy (SEM) & SEM Analysis Services

Scanning Electron Microscopy, commonly known as SEM, is a powerful analytical technique used to examine the surface structure, morphology, composition, and microscopic characteristics of materials at extremely high magnification.

EMSL Analytical, Inc. provides Scanning Electron Microscopy and SEM analysis services for industrial manufacturers, engineers, environmental consultants, product manufacturers, researchers, insurance professionals, building investigators, and other organizations requiring detailed microscopic characterization of particles, surfaces, contaminants, and unknown materials.

SEM analysis can provide valuable information that cannot always be obtained using conventional optical microscopy. By scanning a focused electron beam across a specimen, a scanning electron microscope can produce highly detailed images showing the shape, texture, size, distribution, and morphology of microscopic materials.

When combined with Energy Dispersive X-ray Spectroscopy (EDS or EDX), SEM analysis can also provide information about the elemental composition of a material.

Scanning Electron Microscopy uses a focused beam of electrons rather than visible light to examine the surface of a specimen.

As the electron beam interacts with the sample, signals are generated that can be used to create detailed images of the specimen's surface and provide information about its composition.

SEM is especially useful when investigators need to evaluate extremely small particles, fibers, residues, surface defects, contaminants, coatings, deposits, fractures, or unknown materials.

Depending on the sample and analytical objective, SEM testing can provide information concerning:

One of the most useful capabilities associated with Scanning Electron Microscopy is Energy Dispersive X-ray Spectroscopy, commonly referred to as EDS, EDX, or EDAX.

SEM-EDS analysis allows laboratory analysts to examine microscopic materials and obtain information about the elements present within a selected particle or area.

When the electron beam interacts with the specimen, characteristic X-rays are generated. These X-rays can be evaluated to help identify the elemental composition of the material.

SEM-EDS analysis may detect elements such as: